Claims for Patent: 10,730,876

Summary for Patent: 10,730,876

Title:	Synthesis of a compound that modulates kinases
Abstract:	The present disclosure provides processes for the preparation of a compound of formula I: ##STR00001## or a salt thereof, active on the receptor protein kinases c-Kit and/or c-Fms and/or Flt3. The disclosure also provides compounds and processes for the preparation of the compounds that are synthetic intermediates to the compound of formula I.
Inventor(s):	Ibrahim; Prabha N. (Mountain View, CA), Jin; Masayoshi (Tokyo, JP), Matsuura; Shinji (Tokyo, JP)
Assignee:	Plexxikon Inc. (Berkeley, CA) Daiichi Sankyo Company, Limited (Tokyo, JP)
Application Number:	16/510,617
Patent Claims:	1. A crystalline form of a compound of formula II: ##STR00048## prepared by a process comprising: (1) adding the compound of formula II to from about 0.4% v/v wet methyl tert-butyl ether to about 1.5% v/v wet methyl tert-butyl ether to provide a reaction mixture; (2) refluxing the reaction mixture; (3) cooling the reaction mixture to about room temperature; and (4) isolating the crystalline form of the compound of formula II from the reaction mixture. 2. The crystalline form of the compound of formula II according to claim 1, wherein step (1) comprises adding the compound of formula II to about 0.5% v/v wet methyl tert-butyl ether to provide the reaction mixture. 3. The crystalline form of the compound of formula II according to claim 2, wherein step (2) further comprises heating the reaction mixture to a temperature of about 52-53.degree. C. 4. The crystalline form of the compound of formula II according to claim 3, wherein the crystalline form of compound II is characterized by an X-ray powder diffractogram (XRPD) comprising peaks (.+-.0.2.degree.) at 7.1, 16.5, 20.8, 23.2 and 28.1 .degree.2.theta. as determined on a diffractometer using Cu-Ka radiation. 5. The crystalline form of the compound of formula II according to claim 1, wherein the crystalline form of compound II is characterized by an X-ray powder diffractogram (XRPD) comprising peaks (.+-.0.2.degree.) at 7.1, 16.5, 20.8, 23.2 and 28.1 .degree.2.theta. as determined on a diffractometer using Cu-Ka radiation.