Claims for Patent: 9,150,552

Summary for Patent: 9,150,552

Title:	Solid forms of 3-(6-(1-(2,2-difluorobenzo[d][1,3]dioxol-5-yl)cyclopropanecarboxamido)-3-- methylpyridin-2-yl) benzoic acid
Abstract:	The present invention relates to a substantially crystalline and free solid state form of 3-(6-(1-(2,2-difluorobenzo[d][1,3]dioxol-5-yl)cyclopropanecarboxamido)-3-- methylpyridin-2-yl)benzoic acid (Form I), pharmaceutical compositions thereof, and methods of treatment therewith.
Inventor(s):	Keshavarz-Shokri; Ali (San Diego, CA), Zhang; Beili (San Diego, CA), Krawiec; Mariusz (Marlborough, MA)
Assignee:	Vertex Pharmaceuticals Incorporated (Boston, MA)
Application Number:	14/470,836
Patent Claims:	1. A method of treating cystic fibrosis in a patient comprising administering to the patient an effective amount of 3-(6-(1-(2,2-Difluorobenzo[d][1,3]dioxol-5-yl)cyclopropanecarboxamido)-3-- methylpyridin-2-yl)benzoic acid characterized as Form I and N-(5-hydroxy-2,4-ditert-butyl-phenyl)-4-oxo-1H-quinoline-3-carboxamide, wherein the patient has a defective gene that causes a deletion of phenylalanine at position 508 of the cystic fibrosis transmembrane conductance regulator amino acid sequence. 2. The method of claim 1, wherein the patient has two copies of the defective gene. 3. The method of claim 1, wherein the Form I is characterized by one or more peaks at 15.2 to 15.6 degrees, 16.1 to 16.5 degrees, and 14.3 to 14.7 degrees in an X-ray powder diffraction obtained using Cu K alpha radiation. 4. The method of claim 3, wherein the Form I is characterized by one or more peaks at 15.4, 16.3, and 14.5 degrees. 5. The method of claim 4, wherein the Form I is further characterized by a peak at 14.6 to 15.0 degrees. 6. The method of claim 5, wherein the Form I is further characterized by a peak at 14.8 degrees. 7. The method of claim 5, wherein the Form I is further characterized by a peak at 17.6 to 18.0 degrees. 8. The method of claim 7, wherein the Form I is further characterized by a peak at 17.8 degrees. 9. The method of claim 7, wherein the Form I is further characterized by a peak at 16.4 to 16.8 degrees. 10. The method of claim 9, wherein the Form I is further characterized by a peak at 16.6 degrees. 11. The method of claim 9, wherein the Form I is further characterized by a peak at 7.6 to 8.0 degrees. 12. The method of claim 11, wherein the Form I is further characterized by a peak at 7.8 degrees. 13. The method of claim 11, wherein the Form I is further characterized by a peak at 25.8 to 26.2 degrees. 14. The method of claim 13, wherein the Form I is further characterized by a peak at 26.0 degrees. 15. The method of claim 13, wherein the Form I is further characterized by a peak at 21.4 to 21.8 degrees. 16. The method of claim 15, wherein the Form I is further characterized by a peak at 21.6 degrees. 17. The method of claim 16, wherein the Form I is further characterized by a peak at 23.1 to 23.5 degrees. 18. The method of claim 17, wherein the Form I is further characterized by a peak at 23.3 degrees. 19. The method of claim 1, wherein the Form I is characterized by a diffraction pattern substantially similar to that of FIG. 1. 20. The method of claim 1, wherein the Form I is characterized by a diffraction pattern substantially similar to that of FIG. 2. 21. The method of claim 1, wherein the particle size distribution of D90 is about 82 .mu.m or less. 22. The method of claim 1, wherein the particle size distribution of D50 is about 30 .mu.m or less.